Elmen Consultants
Elmen Consultants
Semiconductor Test

 

From the lab to the production line.

Software and hardware for highly complex integrated circuits.

Test Program Technologies

  • Digital Test (Scan, ATPG)

  • Dynamic DC Testing

  • High-Speed Digital (SERDES)

  • Analogue and Mixed Signal (ADC/DAC, PLL)

  • RF Tests (Frontend/Source)

  • Device Trimming, Efuse/NVM

Custom Test Solutions

  • Probe Card and Loadboard Design with industry partner

  • Tester-Transparent loadboard enhancements - clock sources, high-speed extensions, microcontroller and FPGA solutions.

  • Electronic Hardware and Software Engineering

Test System Support

  • Advantest 93000 Series SoC Test System - all variants and SmarTest Versions

    • SmartScale and PinScale Systems: PS1600, PS9G, PS800/PS400

    • PortScale RF and Mixed Signal Instruments (Source/FE/MB-AV8/AV8)

    • Dynamic DC AVI64/VI32/DPS128

    • Legacy systems HP/Agilent/Verigy 82/83/93000 Single Density Series C400/P1000 (SmarTest 5.4, 6.5)

  • Teradyne Catalyst, A500 Series

  • Cohu/Xcerra/LTXC DiamondX with UNISON

  • Weetech W434 with CEETIS/ATS

  • Custom Test Equipment Setup GPIB/SCPI/LAN/RS232/Modbus

Analysis

Analysing a test program reveals signification information. How is the quality of the code? Where are the bottlenecks? Using in-house developed solutions, static code analysis and statistics, we provide unique insights into the quality and performance of your test program.

Examples

  • Tester Capability Overview: vector memory usage, licence usage, used and unused features.
  • Detailed test time and multisite efficiency reports
  • Software runtime profiling
  • Code quality: Find duplications, unused code, potential bugs, coding style compliance
  • Find opportunities for optimisation (parallelism, test time, memory usage)

 

Optimisation

We provide services for getting the most out of your tester. In addition to improved code, we can optimise new and existing patterns for minimum vector memory usage, tester cycle speed or software time complexity.

Examples

  • Settling Time Adjustments
  • Time complexity code improvements
  • Regenerate patterns for reduced memory usage
  • Regenerate patterns to optimise tester cycle
  • Multi-threaded postprocessing and background download.
  • Single-to-Multisite Conversion
  • Platform migration (test time, obsolescence, cost reduction)

 Training

We offer remote and classroom training on the Advantest 93000 Series Tester. Training is tailored for the customers use. Common topics are:

  • Getting Started with the Advantest 93000: Pin config, levels, timing, patterns, analog sets, utility lines etc

  • Dynamic DC Programming with Pattern Events or SmartRDI: Take full advantage of the Advantest 93000’s capability for fully pattern controlled current and voltage measurements.

  • Analog and Mixed Signal Testing with AWG/Digitizer and DC Scale